Optical tomography based on phase-shifting schlieren deflectometry

Emmanuel Foumouo; Jean-Luc Dewandel; Luc Joannes; Didier Beghuin; Laurent Jacques; Philippe Antoine

doi:10.1117/12.854063

13 May 2010 Optical tomography based on phase-shifting schlieren deflectometry

Emmanuel Foumouo, Jean-Luc Dewandel, Luc Joannes, Didier Beghuin, Laurent Jacques, Philippe Antoine

Proceedings Volume 7726, Optical Sensing and Detection; 77260U (2010) https://doi.org/10.1117/12.854063
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

We present a new optical tomography technique based on phase-shifting schlieren deflectometry. The principle is that of computerized tomography. The three-dimensional profile is reconstructed from the deflection angles of rays passing through the tested object. We have investigated optical phantoms chosen in view of the characterization of dendritic growth in a solidification process. Promising results have been obtained with a homogeneous sphere and a bundle of 200μm fibers. The deviation angles exceed two degrees with a variation of the refractive index ▵n=0.025.

Citation Download Citation

Emmanuel Foumouo, Jean-Luc Dewandel, Luc Joannes, Didier Beghuin, Laurent Jacques, and Philippe Antoine "Optical tomography based on phase-shifting schlieren deflectometry", Proc. SPIE 7726, Optical Sensing and Detection, 77260U (13 May 2010); https://doi.org/10.1117/12.854063

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