X-ray pencil beam facility for optics characterization

Michael Krumrey; Levent Cibik; Peter Müller; Marcos Bavdaz; Eric Wille; Marcelo Ackermann; Maximilien J. Collon

doi:10.1117/12.857335

29 July 2010 X-ray pencil beam facility for optics characterization

Michael Krumrey, Levent Cibik, Peter Müller, Marcos Bavdaz, Eric Wille, Marcelo Ackermann, Maximilien J. Collon

Proceedings Volume 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray; 77324O (2010) https://doi.org/10.1117/12.857335
Event: SPIE Astronomical Telescopes + Instrumentation, 2010, San Diego, California, United States

Abstract

The Physikalisch-Technische Bundesanstalt (PTB) has used synchrotron radiation for the characterization of optics and detectors for astrophysical X-ray telescopes for more than 20 years. At a dedicated beamline at BESSY II, a monochromatic pencil beam is used by ESA and cosine Research since the end of 2005 for the characterization of novel silicon pore optics, currently under development for the International X-ray Observatory (IXO). At this beamline, a photon energy of 2.8 keV is selected by a Si channel-cut monochromator. Two apertures at distances of 12.2 m and 30.5 m from the dipole source form a pencil beam with a typical diameter of 100 μm and a divergence below 1". The optics to be investigated is placed in a vacuum chamber on a hexapod, the angular positioning is controlled by means of autocollimators to below 1". The reflected beam is registered at 5 m distance from the optics with a CCD-based camera system. This contribution presents design and performance of the upgrade of this beamline to cope with the updated design for IXO. The distance between optics and detector can now be 20 m. For double reflection from an X-ray Optical Unit (XOU) and incidence angles up to 1.4°, this corresponds to a vertical translation of the camera by 2 m. To achieve high reflectance at this angle even with uncoated silicon, a lower photon energy of 1 keV is available from a pair of W/B₄C multilayers. For coated optics, a high energy option can provide a pencil beam of 7.6 keV radiation.

Citation Download Citation

Michael Krumrey, Levent Cibik, Peter Müller, Marcos Bavdaz, Eric Wille, Marcelo Ackermann, and Maximilien J. Collon "X-ray pencil beam facility for optics characterization", Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77324O (29 July 2010); https://doi.org/10.1117/12.857335

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available