Characterization and absolute QE measurements of delta-doped N-channel and P-channel CCDs

Blake C. Jacquot; Steve P. Monacos; Todd J. Jones; Jordana Blacksberg; Michael E. Hoenk; Shouleh Nikzad

doi:10.1117/12.857694

13 July 2010 Characterization and absolute QE measurements of delta-doped N-channel and P-channel CCDs

Blake C. Jacquot, Steve P. Monacos, Todd J. Jones, Jordana Blacksberg, Michael E. Hoenk, Shouleh Nikzad

Proceedings Volume 7742, High Energy, Optical, and Infrared Detectors for Astronomy IV; 77420I (2010) https://doi.org/10.1117/12.857694
Event: SPIE Astronomical Telescopes + Instrumentation, 2010, San Diego, California, United States

Abstract

In this paper we present the methodology for making absolute quantum efficiency (QE) measurements from the vacuum ultraviolet (VUV) through the near infrared (NIR) on delta-doped silicon CCDs. Delta-doped detectors provide an excellent platform to validate measurements through the VUV due to their enhanced UV response. The requirements for measuring QE through the VUV are more strenuous than measurements in the near UV and necessitate, among other things, the use of a vacuum monochromator, and good camera vacuum to prevent chip condensation, and more stringent handling requirements. The system used for these measurements was originally designed for deep UV characterization of CCDs for the WF/PC instrument on Hubble and later for Cassini CCDs.

Citation Download Citation

Blake C. Jacquot, Steve P. Monacos, Todd J. Jones, Jordana Blacksberg, Michael E. Hoenk, and Shouleh Nikzad "Characterization and absolute QE measurements of delta-doped N-channel and P-channel CCDs", Proc. SPIE 7742, High Energy, Optical, and Infrared Detectors for Astronomy IV, 77420I (13 July 2010); https://doi.org/10.1117/12.857694

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