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Different materials have different surface scattering characteristics some of which are quite different from each other.
These characteristics can be detected, measured and then matched with models of surface scattering characteristics of
known materials in order to achieve the differentiating of materials in a distant range. In distant field detecting, some
information of the scattered light could not be detected precisely for the detecting range is too distant. Therefore, these
kinds of scattered light information should be eliminated in distant field detecting oriented modeling of material surface
scattering characteristics. In the other hand, those kinds of scattered light information should be maintained which has
not been changed after long range spreading in order to make the model of scattering characteristic simple and easy to be
applied. The measuring of two chosen typical materials indicates that the differences of polarization states of the
scattered light from their surfaces are obvious. Further theoretical arithmetic indicates that these kinds of differences
maintained their significance after the scattered light has been spread for a distant range.
Shixue Xu,Yanru Chen,Lingfei Xu,Jia Li,Feinan Chen, andJingjing Chen
"Distant field detecting oriented modeling method of material surface scattering characteristic", Proc. SPIE 7749, 2010 International Conference on Display and Photonics, 774921 (21 July 2010); https://doi.org/10.1117/12.869467
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Shixue Xu, Yanru Chen, Lingfei Xu, Jia Li, Feinan Chen, Jingjing Chen, "Distant field detecting oriented modeling method of material surface scattering characteristic," Proc. SPIE 7749, 2010 International Conference on Display and Photonics, 774921 (21 July 2010); https://doi.org/10.1117/12.869467