Extraction and analysis of the image in the sight field of comparison goniometer to measure IR mirrors assembly

Zhi-shan Wang; Yue-jin Zhao; Zhuo Li; Liquan Dong; Xuhong Chu; Ping Li

doi:10.1117/12.870454

5 November 2010 Extraction and analysis of the image in the sight field of comparison goniometer to measure IR mirrors assembly

Zhi-shan Wang, Yue-jin Zhao, Zhuo Li, Liquan Dong, Xuhong Chu, Ping Li

Author Affiliations +

Proceedings Volume 7849, Optical Design and Testing IV; 78490J (2010) https://doi.org/10.1117/12.870454
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

The comparison goniometer is widely used to measure and inspect small angle, angle difference, and parallelism of two surfaces. However, the common manner to read a comparison goniometer is to inspect the ocular of the goniometer by one eye of the operator. To read an old goniometer that just equips with one adjustable ocular is a difficult work. In the fabrication of an IR reflecting mirrors assembly, a common comparison goniometer is used to measure the angle errors between two neighbor assembled mirrors. In this paper, a quick reading technique image-based for the comparison goniometer used to inspect the parallelism of mirrors in a mirrors assembly is proposed. One digital camera, one comparison goniometer and one set of computer are used to construct a reading system, the image of the sight field in the comparison goniometer will be extracted and recognized to get the angle positions of the reflection surfaces to be measured. In order to obtain the interval distance between the scale lines, a particular technique, left peak first method, based on the local peak values of intensity in the true color image is proposed. A program written in VC++6.0 has been developed to perform the color digital image processing.

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Zhi-shan Wang, Yue-jin Zhao, Zhuo Li, Liquan Dong, Xuhong Chu, and Ping Li "Extraction and analysis of the image in the sight field of comparison goniometer to measure IR mirrors assembly", Proc. SPIE 7849, Optical Design and Testing IV, 78490J (5 November 2010); https://doi.org/10.1117/12.870454

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