Paper
11 November 2010 The development of optical fringe measurement system integrated with a CMM for products inspection
Hanwei Xiong, Ming Pan, Xiangwei Zhang
Author Affiliations +
Abstract
In the field of industrial product inspection, a CMM (Coordinate Measurement Machine) is indispensable to get high precise dimensions, and it is tedious to inspect a complex shape by manual. For many products, high precise dimensions are only needed on some special features, such as cylinders, holes, and plans. In this paper, an optical fringe measurement system is implemented based on Gray code, and a Canon DSL camera with high resolution is adopted to capture the projection patterns and the coded markers glued on the CMM. The range images from the optical measurement system are automatically aligned with the CMM coordinate system through the coded markers. A greedy feature fitting algorithm is used to processing the obtained points cloud, and the special features are extracted, which are used to direct the CMM to obtain more precise parameters. In this integration system, the whole inspection procedure is automated regardless of the existence of the CAD model of the product. The data from different sensors are fused together by an overlap patch algorithm. As a result, the full surface is scanned, and the necessary precision is guaranteed on some special locations. The design principle and workflow of the integration method are presented, and a detail example is given.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hanwei Xiong, Ming Pan, and Xiangwei Zhang "The development of optical fringe measurement system integrated with a CMM for products inspection", Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78551W (11 November 2010); https://doi.org/10.1117/12.870377
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CITATIONS
Cited by 9 patents.
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KEYWORDS
Inspection

Computer aided design

Clouds

System integration

Solid modeling

Optical testing

Cameras

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