Paper
24 January 2011 Advances in UV sensitive visible blind GaN-based APDs
Author Affiliations +
Abstract
In this paper, we describe our current state-of-the-art process of making visible-blind APDs based on GaN. We have grown our material on both conventional sapphire and low dislocation density free-standing c- and m-plane GaN substrates. Leakage current, gain, and single photon detection efficiency (SPDE) of these APDs are compared. The spectral response and Geiger-mode photon counting performance of UV APDs are studied under low photon fluxes. Single photon detection capabilities with over 30% are demonstrated. We show how with pulse height discrimination the Geiger-mode operation conditions can be optimized for enhanced SPDE versus dark counts.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Melville P. Ulmer, Ryan McClintock, and Manijeh Razeghi "Advances in UV sensitive visible blind GaN-based APDs", Proc. SPIE 7945, Quantum Sensing and Nanophotonic Devices VIII, 79451G (24 January 2011); https://doi.org/10.1117/12.879942
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Avalanche photodetectors

Gallium nitride

Ionization

Electrons

Single photon

Ultraviolet radiation

Sapphire

RELATED CONTENT

Ultraviolet avalanche photodiodes
Proceedings of SPIE (August 28 2015)
III-nitride avalanche photodiodes
Proceedings of SPIE (February 02 2007)
III-nitride-based avalanche photo detectors
Proceedings of SPIE (August 17 2010)
The quantum efficiency and stability of UV and soft x...
Proceedings of SPIE (September 22 2005)

Back to Top