Paper
11 January 2011 Estimation of the concentration of deep traps in organic photoconductors using two-photon absorption
S. V. Novikov, A. R. Tameev, A. V. Vannikov, J.-M. Nunzi
Author Affiliations +
Proceedings Volume 7993, ICONO 2010: International Conference on Coherent and Nonlinear Optics; 799321 (2011) https://doi.org/10.1117/12.881032
Event: International Conference on Coherent and Nonlinear Optics (ICONO 2010) and International Conference on Lasers, Applications and Technologies (LAT 2010), 2010, Kazan, Russian Federation
Abstract
Typically, amorphous organic materials contain high density of traps. Traps hinder charge transport and, hence, affect various working parameters of organic electronic devices. In this paper we suggest a simple but reliable method for the estimation of the concentration of deep traps (traps that keep carriers for a time much longer than the typical transport time of the device). The method is based on the measurement of the dependence of the total charge, collected at the electrode, on the total initial charge, uniformly generated in the transport layer under the action of a light pulse. Advantages and limitations of the method are discussed and an experimental example of the estimation of the density of deep traps in photoconductive organic material poly(2-methoxy-5- (2'-ethylhexyloxy)-1,4-phenylenevinylene (MEH-PPV) is provided.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. V. Novikov, A. R. Tameev, A. V. Vannikov, and J.-M. Nunzi "Estimation of the concentration of deep traps in organic photoconductors using two-photon absorption", Proc. SPIE 7993, ICONO 2010: International Conference on Coherent and Nonlinear Optics, 799321 (11 January 2011); https://doi.org/10.1117/12.881032
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KEYWORDS
Organic materials

Absorption

Electrodes

Diffusion

Organic electronics

Photoresistors

Copper

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