Paper
18 February 2011 Oriented SnS thin films formed by nano-multilayer method
Zhan Xu, Yigang Chen, Weimin Shi, Linjun Wang
Author Affiliations +
Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 799515 (2011) https://doi.org/10.1117/12.888219
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China
Abstract
Tin sulfide (SnS) thin films were prepared by nano-multilayer method on glass substrate followed by thermal annealing at 400 degrees for 3 hours in Argon atmosphere. The films showed strong (040) crystal orientation for the films with stoichiometric ratio (Sn:S) of 1:1. The film had an optical energy band gap Eg=1.44 ev and a P-type conductivity with a resistivity of 5 Ω•cm.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhan Xu, Yigang Chen, Weimin Shi, and Linjun Wang "Oriented SnS thin films formed by nano-multilayer method", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 799515 (18 February 2011); https://doi.org/10.1117/12.888219
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Tin

Sulfur

Multilayers

Thin films

Absorption

Transmittance

Annealing

Back to Top