Paper
25 May 2011 Computational methods for THz material characterization
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Abstract
Characterization of materials with THz waves is not trivial at the moment. Expensive and often bulky equipment, usually laboratory (rather than portable) set-up realization, possible water content, low depth of penetration, etc. are some typical problems. As a result, the desired characteristics of the material are not reliable and often difficult to obtain. In this situation, computational methods may be helpful in alleviating the above difficulties. In the long run, sophisticated mathematical model building may make THz characterization devices more suitable for field applications, implementing portable THz devices and set-ups as well as minimizing the measurement error without repetitive measurements. The computational methods based on time series analysis are described and results provided.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andre Sokolnikov "Computational methods for THz material characterization", Proc. SPIE 8023, Terahertz Physics, Devices, and Systems V: Advance Applications in Industry and Defense, 80230U (25 May 2011); https://doi.org/10.1117/12.885647
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KEYWORDS
Terahertz radiation

Data modeling

Mathematical modeling

Process modeling

Material characterization

Time series analysis

Data processing

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