Phase extraction in microscopy using tunable defocusing by means of a SLM

Luis Camacho; Vicente Micó; Zeev Zalevsky; Javier García

doi:10.1117/12.889591

26 May 2011 Phase extraction in microscopy using tunable defocusing by means of a SLM

Luis Camacho, Vicente Micó, Zeev Zalevsky, Javier García

Proceedings Volume 8082, Optical Measurement Systems for Industrial Inspection VII; 80820O (2011) https://doi.org/10.1117/12.889591
Event: SPIE Optical Metrology, 2011, Munich, Germany

Abstract

In many practical microscopy applications the use of phase information is crucial. In this contribution we propose a method for phase extraction in a microscopy system based on analysis of images with varying defocusing. The system has no mobile parts owing to the defocusing by means of a spatial light modulator. The base of the method is the captre of images in a microscope with varying tube lens focal lengths. This produce a set of intensity images, all of them related, because the can be generated by free space propagation of a complex distribution which is unknown.

Citation Download Citation

Luis Camacho, Vicente Micó, Zeev Zalevsky, and Javier García "Phase extraction in microscopy using tunable defocusing by means of a SLM", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820O (26 May 2011); https://doi.org/10.1117/12.889591

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