Paper
1 January 1987 Superresolution By Differential-Scanning
A. Glindemann
Author Affiliations +
Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967373
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
We are proposing a new principle of measurement that repeals the restriction in resolution caused by the scanning slit. With the boundary condition that scanning is started or ended in a region of known signal level the resolution is limited by the step width only. As the step width may be arbitrarily small the only limitation of resolution is given by the detector sensitivity. In our experiments the resolution was enlarged by a factor of 10 compared with a normal scan process.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Glindemann "Superresolution By Differential-Scanning", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); https://doi.org/10.1117/12.967373
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KEYWORDS
Super resolution

Microscopes

Sensors

Glasses

Signal detection

Spatial filters

Velocity measurements

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