Paper
14 September 2011 Modeling, error analysis, and compensation in phase-shifting surface profilers
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Abstract
Optical metrology techniques have been widely used in geometric dimension and shape measurements due to many features such as non-contact measurement, fast measurement speed, digital data format for computerized analysis and visualization, superior resolution, and high accuracy, etc. Among these techniques, phase-shifting based surface profilers have drawn more and more attention due to its full-field measurement and maturing wrapping/unwrapping analysis characteristics. This paper analyzes the error sources in phase-shifting surface profilers, including phaseshifting generation, non-linearity compensation, phase-shifting algorithms, surface contour extraction, modeling, and calibration, etc. Some methods to improve the measurement accuracy through coordinate error compensation are also proposed including transfer functions and look-up table (LUT) methods.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qingying Jim Hu "Modeling, error analysis, and compensation in phase-shifting surface profilers", Proc. SPIE 8133, Dimensional Optical Metrology and Inspection for Practical Applications, 81330L (14 September 2011); https://doi.org/10.1117/12.894594
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Phase shifts

Calibration

Profilometers

Projection systems

Phase shifting

Error analysis

Cameras

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