Re-definition of effective refractive index of thin film buried quantum dots

Yu-Jen Chen; Cheng-Chung Lee Schmidt; François Flory

doi:10.1117/12.896766

4 October 2011 Re-definition of effective refractive index of thin film buried quantum dots

Yu-Jen Chen, Cheng-Chung Lee Schmidt, François Flory

Proceedings Volume 8168, Advances in Optical Thin Films IV; 81681M (2011) https://doi.org/10.1117/12.896766
Event: SPIE Optical Systems Design, 2011, Marseille, France

Abstract

In this article, we predicted the optical properties of the thin film including quantum dots according to the mathematic mode which is based on the quantum theory. The method consists of two parts. The first one is the classical explanation for the interaction between light and matters. It takes care of the interaction as dipoles and electromagnetic wave and describes clearly the profile of spectrum. Another part is the transition of quantized energy, absorption and spontaneous emission which exhibits singular valleys or peaks in spectrum. For the reason of quantum theory, we have to verify Bohr radius of each crystallized material to make sure that the particle size is small enough to present quantum effect. After constructing the spectrum, the data significantly presents optical properties of matters, we try to re-define the effective refractive index of the thin film including quantum dots by the spectrum which is the result of light affected by matters.

Citation Download Citation

Yu-Jen Chen, Cheng-Chung Lee Schmidt, and François Flory "Re-definition of effective refractive index of thin film buried quantum dots", Proc. SPIE 8168, Advances in Optical Thin Films IV, 81681M (4 October 2011); https://doi.org/10.1117/12.896766

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