Experimental measurement of photonic/plasmonic crystal dispersion, applied to the investigation of surface plasmon dispersion for SERS sensing applications

M. Firdaus A. Muttalib; Swe Zin Oo; Martin D. B. Charlton

doi:10.1117/12.907978

1 February 2012 Experimental measurement of photonic/plasmonic crystal dispersion, applied to the investigation of surface plasmon dispersion for SERS sensing applications

M. Firdaus A. Muttalib, Swe Zin Oo, Martin D. B. Charlton

Author Affiliations +

Proceedings Volume 8264, Integrated Optics: Devices, Materials, and Technologies XVI; 82641C (2012) https://doi.org/10.1117/12.907978
Event: SPIE OPTO, 2012, San Francisco, California, United States

Abstract

In this paper we describe an experimental measurement procedure and automated system for analysis of angle dependent dispersion associated with dielectric photonic crystals or surface Plasmon polariton dispersion associated with nanostructured metallo-dielectric surfaces. This fully automated system utilizes a broadband spectroscopic reflectometry method to acquire polarization resolved data. Angular dispersion is mapped by illuminating a sample with a white light laser ranging from 450nm to 1800nm. A movable fiber probe then collects the reflected signal. Dips in reflectivity then correspond to partially coupled Bloch modes. The measurement system was applied to the investigation of Plasmon dispersion of periodic arrays of metal coated square pyramids SERS sensors. Comparisons are then made to computational simulations derived using RSOFT DiffractMOD based on Rigorous Coupled Wave Analysis (RCWA). Measured experimental dispersion patterns are found to closely match simulation in the exact frame of wavelength (400nm to 900nm).

Citation Download Citation

M. Firdaus A. Muttalib, Swe Zin Oo, and Martin D. B. Charlton "Experimental measurement of photonic/plasmonic crystal dispersion, applied to the investigation of surface plasmon dispersion for SERS sensing applications", Proc. SPIE 8264, Integrated Optics: Devices, Materials, and Technologies XVI, 82641C (1 February 2012); https://doi.org/10.1117/12.907978

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