Paper
15 November 2011 Imaging spectrograph for fast LED optical properties measurement
Kai-Ping Chuang, Fu-Cheng Yang, Yu-Shan Chang, Mao-Sheng Huang
Author Affiliations +
Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 832126 (2011) https://doi.org/10.1117/12.904937
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China
Abstract
Due to the booming in LED applications, fast and accurate inspection tools to monitor LED quality is necessary. In this paper, we propose two new methods to measure LED optical properties by using imaging spectrograph. Imaging-type spectrograph with high spatial and spectral resolutions is designed for LED wafer measurement. Fiber-type spectrograph with multi-head structure is designed for LED backlight and LED light-bar measurement. Optical properties of LED include chromaticity and luminous intensity, which are measured by following CIE recommendations. The performance of imaging spectrograph is evaluated to meet industrial requirements for LED measurement.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kai-Ping Chuang, Fu-Cheng Yang, Yu-Shan Chang, and Mao-Sheng Huang "Imaging spectrograph for fast LED optical properties measurement", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832126 (15 November 2011); https://doi.org/10.1117/12.904937
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KEYWORDS
Light emitting diodes

Spectrographs

Optical properties

Semiconducting wafers

Spectroscopy

LED backlight

Optical testing

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