Paper
8 June 2012 A SVM regression predicting model for indentation depth of welding spot based on digital image processing
Jin Zhang, Peng-xian Zhang
Author Affiliations +
Proceedings Volume 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012); 83342H (2012) https://doi.org/10.1117/12.956422
Event: Fourth International Conference on Digital Image Processing (ICDIP 2012), 2012, Kuala Lumpur, Malaysia
Abstract
The indentation depth of resistance spot welding joint is closely related to its quality, and the digital image of its surface is used as an information source. An evaluating algorithm of artificial intelligence for the indentation depth is put forward. Firstly, through analyzing characteristics of images on the surface of spot welding joints, the first ring area S1, the second ring area S2, total area S, the area ratio coefficient between total area and first ring area K1, and the area ratio coefficient between total area and second ring area K2 are extracted as evaluation factors of indentation depth. At the same time, S2, S, K1 are selected as characteristic parameters of the indentation depth based on the correlation analysis between the evaluation factors and the indentation depth. Secondly, a support vector machine (SVM) predicting model of the indentation depth is established. The model selects the parameters S2, S, K1, welding current I, and electrode pressure F as the input vector and selects the actual indentation depth hT of welding spot as the target vector. Test results are shown, the correlation coefficient are 0.9958 between model prediction values and actual measured values. The indentation depth of welding spot can be predicted by means of the SVM evaluating algorithm.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jin Zhang and Peng-xian Zhang "A SVM regression predicting model for indentation depth of welding spot based on digital image processing", Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 83342H (8 June 2012); https://doi.org/10.1117/12.956422
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KEYWORDS
Electrodes

Digital image processing

Evolutionary algorithms

Image quality

Digital imaging

Resistance

Sensors

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