Paper
15 November 2011 The study of chip orientation technology based on vision
Yuchan Xie, Zhonghai He
Author Affiliations +
Proceedings Volume 8335, 2012 International Workshop on Image Processing and Optical Engineering; 833518 (2011) https://doi.org/10.1117/12.917783
Event: 2012 International Workshop on Image Processing and Optical Engineering, 2012, Harbin, China
Abstract
A chip visual localization method based on vision for IC packaging equipment was developed to satisfy the high precision requirement in the chip inspection in this paper. The method is based on the combination of Hough transform and prior geometric knowledge of chip. First, a straight line was extracted to match chip image.Then the conversion function of the chip image was deduced based on the straight line endpoint coordinates. Because the relative position coordinates of chip corner are known, the other two endpoints of chip in image can be deduced with substituting the known model coners coordinates into the matching conversion function. Finally, the chip orientation is achieved by linking the corners coordinates. Experimental results have shown that the the chip can be orientated accurately using this method.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuchan Xie and Zhonghai He "The study of chip orientation technology based on vision", Proc. SPIE 8335, 2012 International Workshop on Image Processing and Optical Engineering, 833518 (15 November 2011); https://doi.org/10.1117/12.917783
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KEYWORDS
Hough transforms

Image processing

Image segmentation

Detection and tracking algorithms

Image scaling

Packaging

Inspection

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