Call-graph-based inter-class MM path generation

Wei He; Ruilian Zhao

doi:10.1117/12.920088

11 January 2012 Call-graph-based inter-class MM path generation

Wei He, Ruilian Zhao

Proceedings Volume 8349, Fourth International Conference on Machine Vision (ICMV 2011): Machine Vision, Image Processing, and Pattern Analysis; 834905 (2012) https://doi.org/10.1117/12.920088
Event: Fourth International Conference on Machine Vision (ICMV 11), 2011, Singapore, Singapore

Abstract

Inter-class testing is the testing of classes for composing an object-oriented system or subsystem during integration. MM Path is defined as an interleaved sequence of method executions linked by messages. It represents the interactions between methods in object-oriented software well, hence fits for object-oriented integration testing. However, the current MM Path generation methods only support intra-class testing. In this paper, a call-graph-based approach is proposed to promote MM Path automatic generation from intra-class to inter-class level. The approach is evaluated by controlled experiments on 12 Java benchmark programs with two typical call graph construction algorithms, Class Hierarchy Analysis and Anderson's Points-to Analysis. Then, the impact of the two algorithms on inter-class MM path generation efficiency is studied. The result shows that our approach is practicable and Anderson's Points-to Analysis outperforms Class Hierarchy Analysis for inter-class MM Path generation.

Citation Download Citation

Wei He and Ruilian Zhao "Call-graph-based inter-class MM path generation", Proc. SPIE 8349, Fourth International Conference on Machine Vision (ICMV 2011): Machine Vision, Image Processing, and Pattern Analysis, 834905 (11 January 2012); https://doi.org/10.1117/12.920088

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Statistical analysis

Java

Analytical research

Solids

Lab on a chip

Machine vision

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