Paper
13 January 2012 Fault diagnosis based on signed directed graph and support vector machine
Xiaoming Han, Qing Lv, Gang Xie, Jianxia Zheng
Author Affiliations +
Abstract
Support Vector Machine (SVM) based on Structural Risk Minimization (SRM) of Statistical Learning Theory has excellent performance in fault diagnosis. However, its training speed and diagnosis speed are relatively slow. Signed Directed Graph (SDG) based on deep knowledge model has better completeness that is knowledge representation ability. However, much quantitative information is not utilized in qualitative SDG model which often produces a false solution. In order to speed up the training and diagnosis of SVM and improve the diagnostic resolution of SDG, SDG and SVM are combined in this paper. Training samples' dimension of SVM is reduced to improve training speed and diagnosis speed by the consistent path of SDG; the resolution of SDG is improved by good classification performance of SVM. The Matlab simulation by Tennessee-Eastman Process (TEP) simulation system demonstrates the feasibility of the fault diagnosis algorithm proposed in this paper.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoming Han, Qing Lv, Gang Xie, and Jianxia Zheng "Fault diagnosis based on signed directed graph and support vector machine", Proc. SPIE 8349, Fourth International Conference on Machine Vision (ICMV 2011): Machine Vision, Image Processing, and Pattern Analysis, 83491H (13 January 2012); https://doi.org/10.1117/12.920384
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Cited by 1 scholarly publication.
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KEYWORDS
Computer simulations

Temperature metrology

Data modeling

Diagnostics

Liquids

Lithium

MATLAB

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