Laser speckle MTF processing and test development for VIS and IR sensors

Paul P. K. Lee; Craig W. McMurtry; Edwin J. Tan; Judith L. Pipher; Mark V. Bocko; J. Daniel Newman

doi:10.1117/12.919726

18 May 2012 Laser speckle MTF processing and test development for VIS and IR sensors

Paul P. K. Lee, Craig W. McMurtry, Edwin J. Tan, Judith L. Pipher, Mark V. Bocko, J. Daniel Newman

Proceedings Volume 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII; 835507 (2012) https://doi.org/10.1117/12.919726
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

Using band-limited LASER speckle to measure the Modulation Transfer Function (MTF) of an image sensor offers simplified procedure and inexpensive laboratory set up compared with the traditional method of using a knife edge on the sensor imaging plane. This speckle technique has been previously demonstrated by Glen Boreman's group on devices in the visible range. We have extended the procedure to short-wave infrared (IR) sensor at 1.55 micron. Similar measurements were also made at 532 nanometer on a commercial visible (VIS) sensor. The experiments show that the LASER speckle method to be accurate when compared to knife-edge measurements for data below Nyquist. The measured MTF data support optical system design and image quality modeling for both VIS and IR sensing applications.

Citation Download Citation

Paul P. K. Lee, Craig W. McMurtry, Edwin J. Tan, Judith L. Pipher, Mark V. Bocko, and J. Daniel Newman "Laser speckle MTF processing and test development for VIS and IR sensors", Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 835507 (18 May 2012); https://doi.org/10.1117/12.919726

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