Speckle: two new metrology techniques

Dayan Li; Raoul Kirner; Damien P. Kelly; John T. Sheridan

doi:10.1117/12.922493

4 May 2012 Speckle: two new metrology techniques

Dayan Li, Raoul Kirner, Damien P. Kelly, John T. Sheridan

Proceedings Volume 8429, Optical Modelling and Design II; 84290X (2012) https://doi.org/10.1117/12.922493
Event: SPIE Photonics Europe, 2012, Brussels, Belgium

Abstract

Speckle fields are formed when quasi-monochromatic light is scattered by an optically rough surface. These fields are usually described by reference to their first and second order statistical properties. In this paper we review and extend some of these fundamental properties and propose a novel technique for estimating the refractive index of a smooth sample. Theoretical and experimental results are presented. Separately, we also report on a preliminary experiment to determine some characteristics of speckle fields formed in free space by a rotating compound diffuser. Some initial measurements are made where we examine how the speckle intensity pattern in the output plane changes as a function of the relative rotation angle.

Citation Download Citation

Dayan Li, Raoul Kirner, Damien P. Kelly, and John T. Sheridan "Speckle: two new metrology techniques", Proc. SPIE 8429, Optical Modelling and Design II, 84290X (4 May 2012); https://doi.org/10.1117/12.922493

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