Paper
13 September 2012 In situ lifetime testing of organic light emitting diodes
C. W. Merkel, M. G. Helander, J. Qiu, Z. H. Lu
Author Affiliations +
Abstract
A major barrier to commercial adoption of organic light emitting diode (OLED) based devices is their often unacceptably fast rate of degradation. Typically, to estimate device lifetime, electrical parameters such as driving voltage and luminance are periodically measured while constant current is applied to the OLED. Due to the repetitive nature and long timescales involved in lifetime testing, the procedure is an ideal candidate for automation. An automated lifetimetesting system and accompanying software was developed to simultaneously drive multiple OLED devices and collect lifetime parameters while the entire system is under ultra-high vacuum conditions. The system is connected to a larger vacuum chamber so that devices can be synthesized and then analyzed in situ without exposure to atmosphere. The system was developed with the aim of facilitating rapid discovery and understanding of OLED degradation mechanisms.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. W. Merkel, M. G. Helander, J. Qiu, and Z. H. Lu "In situ lifetime testing of organic light emitting diodes", Proc. SPIE 8476, Organic Light Emitting Materials and Devices XVI, 847622 (13 September 2012); https://doi.org/10.1117/12.929978
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Cited by 1 scholarly publication.
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KEYWORDS
Organic light emitting diodes

Photodiodes

Data acquisition

Temperature metrology

Glasses

Control systems

Software development

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