Paper
11 October 2012 Basic optical properties of the photoelastic modulator. Part III: thermal properties
Linda Hirschy, Baoling (Bob) Wang, Jacob Wolf, Bob Lakanen, Brittany Hartmann
Author Affiliations +
Abstract
Hinds Instruments has provided photoelastic modulators (PEMs) to the photonics industry for over 40 years. In the past Bob Wang, et al. from Hinds have made two presentations,1,2 at SPIE meetings, Basic Optical Properties of the Photoelastic Modulator Part I: Useful Aperture and Acceptance Angle and Part II: Residual Birefringence in the Optical Element. This presentation, Part III in the series, addresses the characteristics of the PEM that vary with temperature, highlighting effects on frequency and signal drift due to retardation changes. In addition, Part III will introduce a new PEM with advanced thermal control (PEM-ATC™). Data is presented that shows the increased stability of the PEM frequency and retardation signal using this new device.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Linda Hirschy, Baoling (Bob) Wang, Jacob Wolf, Bob Lakanen, and Brittany Hartmann "Basic optical properties of the photoelastic modulator. Part III: thermal properties", Proc. SPIE 8486, Current Developments in Lens Design and Optical Engineering XIII, 848619 (11 October 2012); https://doi.org/10.1117/12.930285
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Temperature metrology

Photoelastic modulators

Optical components

Modulation

Optical properties

Transducers

Silica

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