Guided wave generation, sensing, and damage detection using in-plane shear piezoelectric wafer

W. Zhou; H. Li; F. G. Yuan

doi:10.1117/12.2008339

19 April 2013 Guided wave generation, sensing, and damage detection using in-plane shear piezoelectric wafer

W. Zhou, H. Li, F. G. Yuan

Proceedings Volume 8692, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2013; 869225 (2013) https://doi.org/10.1117/12.2008339
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2013, San Diego, California, United States

Abstract

This work presents guided wave generation, sensing, and damage detection in metallic plates using in-plane shear (d₃₆ type) piezoelectric wafers as actuators and sensors. The conventional Lead zirconate titanate (PZT) based on induced in-plane normal strain (d₃₁ type) has been widely used to excite and receive guided wave in plates, pipes or thin-walled structures. The d₃₆ type of piezoelectric wafers however induces in-plane (or called face) shear deformation in the plane normal to its polarization direction. This form of electromechanical coupling generates more significant shear horizontal waves in certain wave propagation directions, whose amplitudes are much greater than those of Lamb waves. In this paper, an analysis of shear horizontal (SH) waves generated using in-plane shear electromechanical coupling is firstly presented, followed by a multiphysics finite element analysis for comparison purpose. Voltage responses of both conventional d₃₁ and new d₃₆ sensors are obtained for comparison purpose. Results indicate this type of wafers has potential for simply providing quantitative estimation of damage in structural health monitoring.

Citation Download Citation

W. Zhou, H. Li, and F. G. Yuan "Guided wave generation, sensing, and damage detection using in-plane shear piezoelectric wafer", Proc. SPIE 8692, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2013, 869225 (19 April 2013); https://doi.org/10.1117/12.2008339

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