Paper
31 January 2013 Two improved methods for determining complex permittivity in coaxial line of powder materials
Haihui Zha, Ling Tong, Yu Tian, Bo Gao
Author Affiliations +
Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 87590P (2013) https://doi.org/10.1117/12.2014890
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China
Abstract
In this paper, two improved methods are proposed for determining the complex permittivity of the powder materials from 1 to 18 GHz. Unlike the measurements of solid materials in a two-port coaxial line, two Teflon annular spacers are used to house the powder materials. One method is to obtain the scattering parameters at the reference plane of the powder materials using an improved TRL calibration method, then reconstruct the complex permittivity based on the traditional transmission-line method. The other method is based on the measurements of the scattering parameters of two different length coaxial lines, which only loaded with two Teflon annular spacers or partially loaded with powder materials housed by two Teflon annular spacers. Those two methods are particularly suitable for a small amount of powder materials. Finally the results of the measurements of two powder materials: loess and thin sand are shown, compared with the results measured by Agilent’s 85070E dielectric probe kit.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haihui Zha, Ling Tong, Yu Tian, and Bo Gao "Two improved methods for determining complex permittivity in coaxial line of powder materials", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87590P (31 January 2013); https://doi.org/10.1117/12.2014890
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Scattering

Calibration

Dielectrics

Scatter measurement

Microwave radiation

Waveguides

Particles

RELATED CONTENT


Back to Top