Paper
4 March 2013 Detection of defects on apple using B-spline lighting correction method
Author Affiliations +
Proceedings Volume 8761, PIAGENG 2013: Image Processing and Photonics for Agricultural Engineering; 87610L (2013) https://doi.org/10.1117/12.2019613
Event: Third International Conference on Photonics and Image in Agriculture Engineering (PIAGENG 2013), 2013, Sanya, China
Abstract
To effectively extract defective areas in fruits, the uneven intensity distribution that was produced by the lighting system or by part of the vision system in the image must be corrected. A methodology was used to convert non-uniform intensity distribution on spherical objects into a uniform intensity distribution. A basically plane image with the defective area having a lower gray level than this plane was obtained by using proposed algorithms. Then, the defective areas can be easily extracted by a global threshold value. The experimental results with a 94.0% classification rate based on 100 apple images showed that the proposed algorithm was simple and effective. This proposed method can be applied to other spherical fruits.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiangbo Li, Wenqian Huang, and Zhiming Guo "Detection of defects on apple using B-spline lighting correction method", Proc. SPIE 8761, PIAGENG 2013: Image Processing and Photonics for Agricultural Engineering, 87610L (4 March 2013); https://doi.org/10.1117/12.2019613
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KEYWORDS
Light sources and illumination

Spherical lenses

Defect detection

Binary data

Image segmentation

Algorithm development

Image acquisition

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