Paper
22 June 2013 Development of a fast and accurate color-encoded digital fringe projection profilometry
Author Affiliations +
Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87692E (2013) https://doi.org/10.1117/12.2018756
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
In the past two decades, fringe projection profilometry (FPP) has been widely used in three-dimensional (3D) profile measurement for its fast speed and high accuracy. As a branch of FPP, color-encoded digital fringe projection profilometry (CDFPP) has been applied to surface profile measurement. CDFPP has the advantage of being fast speed, non-contact and full-field. It is one of the most important dynamic 3D profile measurement techniques. However, due to color cross-talk and gamma distortions of electro-optical devices, phase errors arise in using conventional phase-shifting algorithms to retrieve the phase in CDFPP. Therefore, it is important to develop methods for phase error suppression in CDFPP and thus realizing fast and accurate profile measurement. In this paper, a phase error suppression technique is proposed to overcome color cross-talk and gamma distortions. The proposed method is able to carry out fast and accurate surface profile measurement. The real data experimental results show that the proposed method can effectively suppress phase errors and achieve accurate measurements in CDFPP.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Z. Liu, C. Quan, and C. J. Tay "Development of a fast and accurate color-encoded digital fringe projection profilometry", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87692E (22 June 2013); https://doi.org/10.1117/12.2018756
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KEYWORDS
Fourier transforms

Phase shifts

3D metrology

Fringe analysis

Error analysis

Projection systems

CCD cameras

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