Paper
15 March 2013 Monitoring of bread cooling by statistical analysis of laser speckle patterns
Tanya Lyubenova, Elena Stoykova, Elena Nacheva, Branimir Ivanov, Ivan Panchev, Ventseslav Sainov
Author Affiliations +
Proceedings Volume 8770, 17th International School on Quantum Electronics: Laser Physics and Applications; 87700S (2013) https://doi.org/10.1117/12.2013667
Event: Seventeenth International School on Quantum Electronics: Laser Physics and Applications, 2012, Nessebar, Bulgaria
Abstract
The phenomenon of laser speckle can be used for detection and visualization of physical or biological activity in various objects (e.g. fruits, seeds, coatings) through statistical description of speckle dynamics. The paper presents the results of non-destructive monitoring of bread cooling by co-occurrence matrix and temporal structure function analysis of speckle patterns which have been recorded continuously within a few days. In total, 72960 and 39680 images were recorded and processed for two similar bread samples respectively. The experiments proved the expected steep decrease of activity related to the processes in the bread samples during the first several hours and revealed its oscillating character within the next few days. Characterization of activity over the bread sample surface was also obtained.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tanya Lyubenova, Elena Stoykova, Elena Nacheva, Branimir Ivanov, Ivan Panchev, and Ventseslav Sainov "Monitoring of bread cooling by statistical analysis of laser speckle patterns", Proc. SPIE 8770, 17th International School on Quantum Electronics: Laser Physics and Applications, 87700S (15 March 2013); https://doi.org/10.1117/12.2013667
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle

Speckle pattern

Statistical analysis

Image processing

Raster graphics

Visualization

Nondestructive evaluation

Back to Top