Paper
18 November 2013 Some considerations on the integration methods for Hartmann and Hartmann-Shack patterns
Author Affiliations +
Proceedings Volume 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications; 878503 (2013) https://doi.org/10.1117/12.2023357
Event: 8th Ibero American Optics Meeting/11th Latin American Meeting on Optics, Lasers, and Applications, 2013, Porto, Portugal
Abstract
Hartmann and Shack-Hartmann, instead of measuring the wavefront deformations directly they measure the wavefront slopes, which are equivalent to the ray transverse aberrations. Numerous different integration methods had been described in the literature to obtain the wavefront deformations from these measurements. Basically, they can be classified in two different categories, i.e., model and zonal. In this work we briefly describe a modal method to integrate Hartmann, and Shack-Hartmann patterns. Using orthogonal wavefront slope aberration polynomials, instead of the commonly used Zernike polynomials for the wavefront deformations.
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Geovanni Hernández-Gómez, Daniel Malacara-Doblado, Zacarías Malacara-Hernández, Rufino Díaz-Uribe, and Daniel Malacara Hernández "Some considerations on the integration methods for Hartmann and Hartmann-Shack patterns", Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 878503 (18 November 2013); https://doi.org/10.1117/12.2023357
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KEYWORDS
Wavefronts

Monochromatic aberrations

Zernike polynomials

Wavefront sensors

Chromatic aberrations

Laser optics

Geometrical optics

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