Estimating hemispherical scatter from incident plane measurements of isotropic samples scattering from both bulk and surface irregularities

John C. Stover; Sven Schroeder; Alexander von Finck; David Unglaub; Angela Duparré

doi:10.1117/12.2024550

7 September 2013 Estimating hemispherical scatter from incident plane measurements of isotropic samples scattering from both bulk and surface irregularities

John C. Stover, Sven Schroeder, Alexander von Finck, David Unglaub, Angela Duparré

Author Affiliations +

Proceedings Volume 8838, Optical Manufacturing and Testing X; 883803 (2013) https://doi.org/10.1117/12.2024550
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

In the mid-1970’s it became apparent that incident plane scatter data could be represented by simple two or three parameter expressions. This realization made possible the generation of stray light estimation codes which are used on everything from military weapons, to telescopes, to car headlights to flat panel display systems. Almost all of these applications estimate hemispherical scatter from incident plane measurements. The authors’ 2012 review of this process was limited to samples scattering just from surface roughness. In this paper hemispherical measurements are compared to calculations made from incident plane measurements using isotropic samples that scatter from bulk irregularities as well as surface scatter. The issue of non-isotropic samples is briefly introduced. The data is also analyzed to investigate reciprocity.

Citation Download Citation

John C. Stover, Sven Schroeder, Alexander von Finck, David Unglaub, and Angela Duparré "Estimating hemispherical scatter from incident plane measurements of isotropic samples scattering from both bulk and surface irregularities", Proc. SPIE 8838, Optical Manufacturing and Testing X, 883803 (7 September 2013); https://doi.org/10.1117/12.2024550

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