Paper
26 September 2013 Characterization of Si hybrid CMOS detectors for use in the soft x-ray band
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Abstract
We report on the characterization of four HAWAII Hybrid Si CMOS detectors (HCD) developed for use as X-ray detectors as part of a joint program between Penn State University and Teledyne Imaging Sensors (TIS). Interpixel capacitive crosstalk (IPC) has been measured for standard H1RG detectors as well as a specially developed H2RG that uses a unique bonding structure. The H2RG shows significant reduction in IPC, as reported by Griffith et al. 2012. Energy resolution at 1.5 & 5.9 keV was measured as well as read noise for each detector. Dark current as a function of temperature is reported from 150 – 210 K and dark current figures of merit are estimated for each detector. We also discuss upcoming projects including testing of a new HCD called the Speedster-EXD. This prototype detector will have a low noise, high gain CTIA to reduce IPC and read noise as well as in-pixel CDS and event flagging. In the coming year PSU and TIS will begin work on a project to incorporate CTIA and CDS circuitry into the ROIC of a HAWAII HCD like detector to satisfy the small pixel and high rate needs of future X-ray observatories.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zachary R. Prieskorn, Christopher V. Griffith, Stephen D. Bongiorno, Abraham D. Falcone, and David N. Burrows "Characterization of Si hybrid CMOS detectors for use in the soft x-ray band", Proc. SPIE 8859, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII, 88590J (26 September 2013); https://doi.org/10.1117/12.2024259
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Cited by 10 scholarly publications.
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KEYWORDS
Sensors

CMOS sensors

X-rays

X-ray detectors

Readout integrated circuits

Silicon

Aluminum

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