Paper
26 September 2013 Aberration-free silicon pore x-ray optics
Author Affiliations +
Abstract

Silicon Pore Optics is an enabling technology for future L- and M-class astrophysics X-ray missions, which require high angular resolution (~5 arc seconds) and large effective area (1 to 2 m2 at a few keV). The technology exploits the high-quality of super-polished 300 mm silicon wafers and the associated industrial mass production processes, which are readily available in the semiconductor industry. The plan-parallel wafers have a surface roughness better than 0.1 nm rms and are diced, structured, wedged, coated, bent and stacked to form modular Silicon Pore Optics, which can be grouped into a larger optic. The modules are assembled from silicon alone, with all the mechanical advantages, and form an intrinsically stiff pore structure.

The optics design was initially based on long (25 to 50 m) focal length X-ray telescopes, which could achieve several arc second angular resolution by curving the silicon mirror in only one direction (conical approximation).

Recently shorter focal length missions (10 to 20 m) have been discussed, for which we started to develop Silicon Pore Optics having a secondary curvature in the mirror, allowing the production of Wolter-I type optics, which are on axis aberration-free.

In this paper we will present the new manufacturing process, the results achieved and the lessons learned.

© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maximilien J. Collon, Marcelo Ackermann, Ramses Günther, Giuseppe Vacanti, Marco W. Beijersbergen, Marcos Bavdaz, Eric Wille, Kotska Wallace, Jeroen Haneveld, Mark Olde Riekerink, Arenda Koelewijn, Coen van Baren, Peter Müller, Michael Krumrey, Vadim Burwitz, Giorgia Sironi, and Mauro Ghigo "Aberration-free silicon pore x-ray optics", Proc. SPIE 8861, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI, 88610M (26 September 2013); https://doi.org/10.1117/12.2024982
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Cited by 6 scholarly publications.
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KEYWORDS
Silicon

Mirrors

Spatial resolution

X-ray optics

Optics manufacturing

X-rays

Reflection

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