Paper
28 May 2014 Comparing digital-light-processing (DLP) and liquid-crystal-on-silicon (LCoS) technologies for high-quality 3D shape measurement
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Abstract
This paper presents a thorough comparison between the digital-light-processing (DLP) technology and liquid-crystal-onsilicon (LCoS) technology on high-quality 3D shape measurement. Specifically, we will study not only each individual color, but also the combination of different color (i.e., white light). The binary defocusing and focused sinusoidal fringe projection methods will be evaluated under all these scenarios. Experimental data demonstrated that for slow speed measurements, DLP has better fringe contrast and thus higher signal to noise ratio (SNR) for better quality 3D shape measurement when the binary defocusing method is employed, or when proper synchronization is present when the focus sinusoidal method is used; and LCoS provides more flexibility for system development when the focus sinusoidal method is employed.
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Chen Gong, Beiwen Li, Kevin G. Harding, and Song Zhang "Comparing digital-light-processing (DLP) and liquid-crystal-on-silicon (LCoS) technologies for high-quality 3D shape measurement", Proc. SPIE 9110, Dimensional Optical Metrology and Inspection for Practical Applications III, 911004 (28 May 2014); https://doi.org/10.1117/12.2050786
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Cited by 1 scholarly publication.
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KEYWORDS
Digital Light Processing

Projection systems

Liquid crystal on silicon

3D metrology

Cameras

Binary data

Quality measurement

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