Paper
8 October 2014 High barrier properties of transparent thin-film encapsulations for top-emission organic light-emitting diodes
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Abstract
This paper reports a low-temperature thin-film encapsulation (TFE) process based on a low temperature atomic layer deposition ZrO2 layer for top-emission organic light-emitting devices (TEOLEDs). The barrier characteristics of TFE showed a lower water vapor transmission rate (WVTR) of 2.3 × 10−3 g/m2/day and a longer continuous operation lifetime of 6-folds compared to the device without TFE under identical environmental and driving conditions. Furthermore, the emitting light extraction of the device with barrier layers was improved compared to the bare device. The theoretical calculation data were consistent with the experimental results and showed the potential for designing optimized TFE structures for improving light transmission.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hui-Ying Li and Yu Duan "High barrier properties of transparent thin-film encapsulations for top-emission organic light-emitting diodes", Proc. SPIE 9183, Organic Light Emitting Materials and Devices XVIII, 918325 (8 October 2014); https://doi.org/10.1117/12.2062525
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Cited by 1 scholarly publication.
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KEYWORDS
Organic light emitting diodes

Zirconium dioxide

Thin films

Calcium

Atomic layer deposition

Transmittance

Thin film devices

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