New understandings of failure modes in SSL luminaires

Sarah D. Shepherd; Karmann C. Mills; Robert Yaga; Cortina Johnson; J. Lynn Davis

doi:10.1117/12.2062243

18 September 2014 New understandings of failure modes in SSL luminaires

Sarah D. Shepherd, Karmann C. Mills, Robert Yaga, Cortina Johnson, J. Lynn Davis

Proceedings Volume 9190, Thirteenth International Conference on Solid State Lighting; 919018 (2014) https://doi.org/10.1117/12.2062243
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

As SSL products are being rapidly introduced into the market, there is a need to develop standard screening and testing protocols that can be performed quickly and provide data surrounding product lifetime and performance. These protocols, derived from standard industry tests, are known as ALTs (accelerated life tests) and can be performed in a timeframe of weeks to months instead of years. Accelerated testing utilizes a combination of elevated temperature and humidity conditions as well as electrical power cycling to control aging of the luminaires. In this study, we report on the findings of failure modes for two different luminaire products exposed to temperature-humidity ALTs. LEDs are typically considered the determining component for the rate of lumen depreciation. However, this study has shown that each luminaire component can independently or jointly influence system performance and reliability. Material choices, luminaire designs, and driver designs all have significant impacts on the system reliability of a product. From recent data, it is evident that the most common failure modes are not within the LED, but instead occur within resistors, capacitors, and other electrical components of the driver. Insights into failure modes and rates as a result of ALTs are reported with emphasis on component influence on overall system reliability.

Citation Download Citation

Sarah D. Shepherd, Karmann C. Mills, Robert Yaga, Cortina Johnson, and J. Lynn Davis "New understandings of failure modes in SSL luminaires", Proc. SPIE 9190, Thirteenth International Conference on Solid State Lighting, 919018 (18 September 2014); https://doi.org/10.1117/12.2062243

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available