|
|
|
The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this book: Author(s), “Title of Paper,” in Optical System Alignment, Tolerancing, and Verification VIII, edited by José Sasián, Richard N. Youngworth, Proceedings of SPIE Vol. 9195 (SPIE, Bellingham, WA, 2014) Article CID Number. ISSN: 0277-786X ISBN: 9781628412222 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2014, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/14/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print and on CD-ROM. Papers are published as they are submitted and meet publication criteria. A unique, consistent, permanent citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:
AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Avendaño-Alejo, Maximino, 09 Barrett, Harrison H., xi Beaton, Alexander, 0G Burge, James H., 0F Castán Ricaño, Diana, 09 Cata, Brian M., 03 Caucci, Luca, xi Chan, Chia-Yen, 0H, 0K, 0M Chang, Shenq-Tsong, 0H, 0K, 0M Chen, Chia-Ray, 0H Chen, Ching-Wei, 0H Chen, Zexiang, 0P Clark, James H., III, 0A Coulter, Phillip, 0G Dallaire, Xavier, 08 Daykin, Edward P., 03 Esquibel, David L., 03 Feng, Yun, 0I Frogget, Brent C., 03 Ganesan, A. R., 05 Grant, Barbara G., 0B Gregory, Michael K., 07 Gu, Yaxiu, 0L Gum, Jeffery S., 0G Gupta, Anurag, xxix Hadjimichael, Theodore J., 0G Hayden, Joseph E., 0G Herman, Eric, 02 Holtkamp, David B., 03 Hsu, Ming-Ying, 0H Huang, Chih-Yu, 06 Huang, Po-Han, 0H Huang, Po-Hsuan, 0H, 0K Huang, Run, 0F Huang, Ting-Ming, 0H, 0K, 0M Hui, Mei, 0I Hummel, Susann, 0G Hylan, Jason E., 0G Kalikivayi, V., 05 Kannan, K., 05 Kaufman, Morris I., 03, 07 Krishna Kumar, R., 05 Kuhn, William P., 0E Kuo, Ching-Hsiang, 0M Lee, David, 0G Li, Likai, 04 Li, Yanpeng, 0L Liang, Rongguang, 06 Lien, Chun-Chieh, 0H, 0K Light, Brandon B., 07 Lin, Wei-Cheng, 0M Lin, Yu-Chuan, 0M Madison, Timothy J., 0G Malone, Robert M., 03, 07 Martin, Thomas, 04 Maszkiewicz, Michael, 0G McGillivray, Kevin D., 03 Mclean, Kyle F., 0G McMann, Joseph, 0G Melf, Markus, 0G Meng, Qinglong, 0L Miner, Linda, 0G Myers, Kyle J., xi Ohl, Raymond G., IV, 0G Palagi, Martin J., 03 Parks, Robert E., 0E Pazuchanics, Peter, 03 Penado, F. Ernesto, 0A Redman, Kevin, 0G Roedel, Andreas, 0G Romero, Vincent T., 03 Rübenach, Olaf, 04 Schweiger, Paul, 0G Sieber, Ingo, 04 Sorenson, Danny S., 03 Su, Peng, 0F Su, Tianquan, 0I Te Plate, Maurice, 0G Thibault, Simon, 08 Wells, Martyn, 0G Wenzel, Greg W., 0G Williams, Patrick K., 0G Xing, Tingwen, 0P Yi, Allen, 04 Young, Jerrod, 0G Youngworth, Richard N., 02, 06 Zhao, Weirui, 0F Zhao, Yuejin, 0I Zhao, Zhu, 0I Zhou, Ping, 0I Zhu, Hongwei, 0P Conference CommitteeProgram Track Chairs José Sasián, College of Optical Sciences, The University of Arizona (United States) R. John Koshel, College of Optical Sciences, The University of Arizona (United States) Conference Chairs José Sasián, College of Optical Sciences, The University of Arizona (United States) Richard N. Youngworth, Riyo LLC (United States) Conference Program Committee Matthew B. Dubin, College of Optical Sciences, The University of Arizona (United States) Jonathan D. Ellis, University of Rochester (United States) Sen Han, University of Shanghai for Science and Technology (China) Marco Hanft, Carl Zeiss AG (Germany) Chao-Wen Liang, National Central University (Taiwan) Norbert Lindlein, Friedrich-Alexander-Universität Erlangen-Nürnberg (Germany) Robert M. Malone, National Security Technologies, LLC (United States) Raymond G. Ohl IV, NASA Goddard Space Flight Center (United States) Robert E. Parks, Optical Perspectives Group, LLC (United States) Martha Rosete-Aguilar, Universidad Nacional Autónoma de México (Mexico) Daniel G. Smith, Nikon Research Corporation of America (United States) Peng Su, College of Optical Sciences, The University of Arizona (United States) Yana Z. Williams, Atlas Material Testing Technology (United States) Session Chairs 1 Optical Design and Tolerance Analysis I Peng Su, College of Optical Sciences, The University of Arizona (United States) 2 Optical Design and Tolerance Analysis II Robert M. Malone, National Security Technologies, LLC (United States) 3 Verification for Optical Systems Robert E. Parks, Optical Perspectives Group, LLC (United States) 4 Metrology in Alignment, Tolerancing, and Verification José Sasián, College of Optical Sciences, The University of Arizona (United States) IntroductionWe never cease to be grateful to the wonderful community that makes this niche specialty conference so memorable. This year, the eighth in the conference series, was certainly no exception to this sentiment. The 2014 Optical System Alignment, Tolerancing, and Verification VIII conference in San Diego was once again excellent. As usual our conference consisted of a day of quality presentations, poster session, and subsequent proceedings articles. We had four sessions involving optical design and tolerance analysis, verification, and alignment of optical systems. We sincerely thank our invited speakers, contributed speakers, poster paper presenters, and the superb community for our success in this conference. The community clearly values this conference and the exchange of ideas it creates. We must of course thank our program committee for continuing to promote this conference. Finally we thank the volunteers and SPIE staff for providing us the opportunity to cover the subjects of optical system alignment, tolerancing, and verification in a dedicated conference and proceedings volume. This conference will continue in 2015, which is the International Year of Light. We encourage everyone interested in optical system alignment, tolerancing, and verification to look for the call for papers and to submit your work in early 2015. Please feel free to contact us or anyone on our program committee if you have any questions. In the meantime, we wish you all the best in your endeavors. José Sasián Richard N. Youngworth |
