Measure of a zinc oxide (ZnO) film thickness using a point diffraction interferometer

Esteban Rueda-Soriano; Heberto Gómez-Pozos; José L. González-Vidal; A. Muñoz Potosi; Luis G. Valdivieso-González

doi:10.1117/12.2062098

18 August 2014 Measure of a zinc oxide (ZnO) film thickness using a point diffraction interferometer

Esteban Rueda-Soriano, Heberto Gómez-Pozos, José L. González-Vidal, A. Muñoz Potosi, Luis G. Valdivieso-González

Proceedings Volume 9203, Interferometry XVII: Techniques and Analysis; 920317 (2014) https://doi.org/10.1117/12.2062098
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

The use of zinc oxide (ZnO) for its application as gas sensor is frequent in the industry. One important element for the characterization of this kind of structure is the measurement of the material thickness deposited on a substrate. In this work, an optical method for determining the measure of the ZnO material thickness, in this case a point diffraction interferometer (PDI) is used. The PDI uses few optical elements in the arrangement and its low cost represents an easy implementation. Also, the ZnO sample does not require any chemical treatment to be measure; consequently it does not need an extra step in the measurement process. The purpose of this arrangement is to implement it as a measuring tool for the laboratory of sensor films of the Autonomous University of the State of Hidalgo. For early results, it is proposed to measure the thickness of a ZnO film larger than one micron of the ZnO film, and the results are compared with the traditional method using a talkstep.

Citation Download Citation

Esteban Rueda-Soriano, Heberto Gómez-Pozos, José L. González-Vidal, A. Muñoz Potosi, and Luis G. Valdivieso-González "Measure of a zinc oxide (ZnO) film thickness using a point diffraction interferometer", Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 920317 (18 August 2014); https://doi.org/10.1117/12.2062098

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KEYWORDS

Zinc oxide

Point diffraction interferometers

Wavefronts

Interferometers

Refractive index

Glasses

Interferometry

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