Precision vacuum spectral reflectivity test system

Haifang Cong

doi:10.1117/12.2068392

18 November 2014 Precision vacuum spectral reflectivity test system

Haifang Cong

Proceedings Volume 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics; 929806 (2014) https://doi.org/10.1117/12.2068392
Event: International Symposium on Optoelectronic Technology and Application 2014, 2014, Beijing, China

Abstract

Remote sensing instrument must be calibrated the optics reflectance of the instrument in vacuum conditions before lauched. To obtain the spectral reflectivity of less than 200 millimeter diameter optical element in vacuum, the reflectance of test system is constructed. The reflectivity of the test system is consisted of a light source, the Seya-Namioka vacuum visible monochromator, the sample room as the main structural and electronic system components. It describes how the optical systems and electronic are designed. The monochromator worked band is from 400nm to 780nm, spectral resolution is 0.5nm. Dual optical compensation method is used to eliminate the source of time drift, improve the measurement accuracy with phase-locked weak signal amplification method. The system used a lock-in amplifier according to the technique using the principle of coherent detection of the modulated optical signal which is multiplied with the reference signal processed, by using the optical integrator the signal will be smoothed sended to A / D converter. To ensure the precision measurement deteced, the phase-sensitive detector function can be adjustable. The output value is not more than 10mV before each measurement, so it can be ensured that the stability of the measured radiation spectrum is less than 1 percent. The reflectivity of the test system results is shown that the wavelength accuracy is 0.1nm, and the wavelength repeatability is 0.05nm, it can achievehigh-precision measurement of optical components under vacuum body.

Citation Download Citation

Haifang Cong "Precision vacuum spectral reflectivity test system", Proc. SPIE 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics, 929806 (18 November 2014); https://doi.org/10.1117/12.2068392

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Sensors

Reflectivity

Optical components

Visible radiation

Monochromators

Photomultipliers

Control systems

Show All Keywords

Keywords/Phrases

Search In:

Publication Years