Paper
16 January 1989 Digital Processing Of Young's Fringes In Speckle Photography
D. J. Chen, F. P. Chiang
Author Affiliations +
Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947604
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Abstract
A new technique for fully automatic diffraction fringe measurement in point-wise speckle photograph analysis is presented in this paper. The fringe orientation and spacing are initially estimated with the help of 1-D FFT. A 2-D convolution filter is then applied to enhance the estimated image . High signal-to-noise rate (SNR) fringe pattern is achieved which makes it feasible for precise determination of the displacement components. The halo-effect is also optimally eliminated in a new way. With the computation time compared favorably with those of 2-D autocorrelation method and the iterative 2-D FFT method. High reliability and accurate determination of displacement components are achieved over a wide range of fringe density.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. J. Chen and F. P. Chiang "Digital Processing Of Young's Fringes In Speckle Photography", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947604
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KEYWORDS
Fringe analysis

Diffraction

Photography

Speckle

Optical testing

Signal detection

Silicon

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