High-performance near-infrared spectrally encoded microscopy by using a balanced detector

Jiuling Liao; Wanrong Gao

doi:10.1117/12.2187792

28 August 2015 High-performance near-infrared spectrally encoded microscopy by using a balanced detector

Jiuling Liao, Wanrong Gao

Proceedings Volume 9609, Infrared Sensors, Devices, and Applications V; 96090V (2015) https://doi.org/10.1117/12.2187792
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

Spectrally encoded microscopy (SEM) is a new microscopic imaging technique in which a grating is used to illuminate different positions along a line on the sample with different wavelengths, reducing the size of system and imaging time. In this paper, a SEM device is described which is based on a swept source and a balanced detection. A fixed gain balanced detector (BD) was employed in the system for detecting the low sample light without amplifier. Compared to conventional SEM detection method, our BD-SEM device has two significant advantages, one is its capability of suppressing common-mode noise and thermal noise, resulting in the lateral resolution better than direct detection, the other is that it can amplify the signal intensity which is particularly helpful for tissue reflectance imaging. The lateral resolution was measured by imaging a USAF resolution target. The images of onion cells were obtained. The data showed that both the lateral resolution and signal noise ratio are better than non-BD method. The method presented in this work is helpful for developing miniature endoscopic probe for in vivo tissue visualization with high acquisition speed and high imaging quality.

Citation Download Citation

Jiuling Liao and Wanrong Gao "High-performance near-infrared spectrally encoded microscopy by using a balanced detector", Proc. SPIE 9609, Infrared Sensors, Devices, and Applications V, 96090V (28 August 2015); https://doi.org/10.1117/12.2187792

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KEYWORDS

Scanning electron microscopy

Sensors

Image resolution

Signal to noise ratio

Diffraction gratings

Microscopy

Interference (communication)

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