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The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this book: Author(s), “Title of Paper,” in 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, edited by Jigui Zhu, Hwa-Yaw Tam, Kexin Xu, Hai Xiao, Sen Han, Proceedings of SPIE Vol. 9623 (SPIE, Bellingham, WA, 2015) Article CID Number. ISSN: 0277-786X ISBN: 9781628418040 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445 Copyright © 2015, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:
The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages. AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Bai, Jian, 03, 1F Bi, Chao, 0K Cai, Chuan, 0S Cai, Zhijian, OW Cao, Xuedong, 0N Chen, Lin, 0M, 0N Chen, Xiaoyu, 03 Chen, Yan, 0J, 1I Chen, Yang, 0F Chen, Zhe, 0Z Cui, Chengjun, 0E Cui, Cunxing, 1B Dong, Dengfeng, 0G Dong, Hao, 1G, 1H Dong, Liquan, 07, 09, 0D, 0R, 14 E, Kewei, 19 Fan, Tianquan, 0M Fan, Zhen-zhong, 0K Feng, Qibo, 1B Feng, Wei, 1C Fu, Luhua, 08, 0I, 0X, 16, 1E Fu, Xiaoyu, 0H Gan, Lu, 15 Gao, Chun-ming, 15 Gao, Mingxing, 0M, 0N Ge, Chunfeng, 0H Geng, Xin, 0Z Gou, Jiansong, 10 Guo, Siyang, 0F Guo, Yin, 0I Guo, Youwei, 0X Han, Peng, 18 Han, Ying, 0R Hao, Bingtao, 0H Hao, YunCai, 12 He, Qi-rui, 15 He, Shufang, 0J, 1I He, Yingwei, 0S He, Yong-qiang, 0Q Healy, John J., 0Y Hong, Baoyu, 0H Hong, Tianqi, 0F Hong, Zhihan, 19 Hu, Hong, 0V Hu, Xinqi, 0A Hu, Zhixiong, 0H Huang, Yifan, 06 Huang, Zhe, 0F Huang, Zhen, 0L Hui, Mei, 07, 09, 0D, 14 Jia, Bingtian, 16 Jia, Dongfang, 0H Jing, Hongwei, 0M, 0N Kong, Lingqin, 0R Lao, Dabao, 0E, 0G Li, Chengxu, 19 Li, Dahai, 19 Li, Fei, 0A Li, Feng, 0T Li, Jie, 0M Li, Jintao, 13 Li, Lin, 06 Li, Mengyang, 19 Li, Xinghui, 1G, 1H Li, Xingqiang, 16 Li, Yang, 13 Li, Yanhong, 0R Li, YaSheng, 0J, 1I Li, Yonghui, 07, 14 Li, Zhen, 0V Liang, Yiyong, 1F Liao, Ningfang, 0J, 1I Lin, Jiarui, 0B Ling, Tong, 03 Liu, Changjie, 08, 0I, 16, 1E Liu, Da, 12 Liu, Dingpu, 0S Liu, Dong, 03 Liu, Guangyi, 02 Liu, Guodong, 0L Liu, Haiqing, 08, 0B Liu, Ming, 07, 09, 0D, 0R, 14 Liu, Shouqi, 1C Liu, Weihua, 1B Liu, Wenjing, 0X Liu, Wenli, 0H Liu, Wenlong, 13 Liu, Xiaohua, 07, 09, 0D, 14 Liu, Xintong, 0O Liu, Yanlei, 1D Liu, Yuankun, 1C Liu, Yufang, 1D Liu, Zhilong, 0C Lu, Qianbo, 1F Lu, Ruijun, 10 Lu, Zengxiong, 02 Luo, Kaiqing, 18 Lv, Dongdong, 13 Lv, Hang, 1I Lyu, Hang, 0J Meng, Haifeng, 0S Meng, Qingbin, 02 Meng, Qingyu, 11 Mi, Yuhe, 06 Ni, Kai, 17, 1G, 1H Ou, Guangli, 17 Qi, Yuejing, 02 Qian, Xiang, 17 Qiao, Lin, 1A Qiu, Jian, 18 Qu, Xinghua, 0Z Ren, Yongjie, 0B, 0F Ren, Zhong, 0L Sa, Renna, 0R Shang, Mingnuo, 1E Shao, Z. F., 0U Shen, Xinlan, 10 Shen, Yibing, 03 Song, Zhijun, 1A Su, Jiani, 02 Su, Yuling, 13, 1A Su, Zhan, 1A Sun, Changku, 0O, 0P Sun, Pengfei, 0P Sun, Qianqian, 0A Tang, Yiming, 1A Tian, Yi, 0R Tong, Weichao, 0C Wan, Lifang, 0J, 1I Wan, Ruyi, 0V Wang, Biao, 0C Wang, Kai, 11 Wang, Kaiwei, 1F Wang, Li, 0T, 12 Wang, Liqiang, 04 Wang, Peng, 0O, 0P Wang, Shanshan, 11 Wang, Xiaohao, 17 Wang, Xinjie, 13, 1A Wang, Yakun, 07, 14 Wang, Zhong, 0X, 10, 16 Wu, Guanhao, 1G, 1H Wu, Jian, 04 Wu, Jianhong, OW Wu, Xiaobin, 18 Wu, Y. Q., 0U Xie, Linlin, 0S Xiong, Limin, 0S Xu, Jisen, 18 Xu, Kaipin, 1D Xu, Mingfei, 1G, 1H Yang, Hongzhi, 05 Yang, Jie, 0N Yang, Linghui, 0B Yang, Ma-ying, 0T Yang, Que, 11 Yang, Suhui, 05 Yang, Yongying, 03 Yao, Youwei, 0V Yu, Kun, 1D Yu, Quan, 17 Yu, Zhou, 17 Yuan, Bo, 04 Zeng, Lvming, 0L Zhai, Xiaohao, 07, 14 Zhai, Yusheng, 13, 1A Zhang, Bifeng, 0S Zhang, Chen, 19 Zhang, Chunyu, 11 Zhang, Dehua, 05 Zhang, Dong-xiao, 0Q Zhang, Feng, 1D Zhang, Fumin, 0Z Zhang, Haijun, 0I Zhang, Haiyang, 05 Zhang, Jinsong, 0V Zhang, Jun, 12 Zhang, Junchao, 0S Zhang, Kaihua, 1D Zhang, Lei, 03 Zhang, Li, 0R Zhang, Lu, 11 Zhang, Qican, 1C Zhang, Sai, 1F Zhang, Shiqi, 0D Zhang, Wenying, 0E Zhang, Xiaoguo, 17 Zhang, Xi-ren, 15 Zhang, Y. F., 0U Zhang, Yan, 08 Zhang, Yihui, 0P Zhang, Zhifeng, 13, 1A Zhang, Zili, 0G Zhao, Changming, 05 Zhao, Yuejin, 07, 09, 0D, 0R, 14 Zhao, Zhu, 0D Zheng, Zheng, 05 Zhou, Bin, 1F, Zhou, Peng, 07, 14 Zhou, Qian, 1G, 1H Zhou, Tingting, 04 Zhou, Weihu, 0E, 0G Zhou, Ying, 15 Zhu, Jigui, 0B Zhu, Qiudong, 11 Zou, Wenlong, OW Symposium CommitteeGeneral Chairs Conference Co-chairs
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IntroductionThe optoelectronic principle plays an outstanding role in the field of metrology and testing areas, as it provides an important method for the development of measurement technology. With the rapid development of information and measurement technology, systems that obtain sources of information have drawn much attention. New measurement requirements appear constantly, which promote continuous development of the optoelectronic measurement method, technology, and application, as well as bring vigor and vitality to the research on optoelectronic measurement. Optoelectronic measurement research covers a range of content, from scientific research to that of the manufacturing industry and daily life. The aim will be to continue expanding and gathering content. Traditional optoelectronic measurement research and applications have been consistently improving in the field of industrial manufacturing precision measurement technology and concerned performances. Furthermore, the needs of optoelectronic measurement represented in the measurement of digital cultural heritage and environment protection have been emerging ceaselessly alongside the development of measuring methods and applications. A total of 53 papers are included in these proceedings from the Optoelectronic Measurement Technology and System branch of OIT’ 2015. The papers apply to research fields including: optoelectronic measurement, optical instruments, industrial measurement, grating projection, spectral measurement, and optical fiber measurement. These papers appropriately reflect the current focus and research level of the optoelectronic measurement field. Jigui Zhu Hwa-Yaw Tam Kexin Xu Hai Xiao Sen Han Sponsors and Cooperating OrganizationsSponsored by CIS—China Instrument and Control Society (China) SPIE
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