Improved zonal wavefront reconstruction algorithm for Hartmann type test with arbitrary grid patterns

Mengyang Li; Dahai Li; Chen Zhang; Kewei E; Zhihan Hong; Chengxu Li

doi:10.1117/12.2193310

7 August 2015 Improved zonal wavefront reconstruction algorithm for Hartmann type test with arbitrary grid patterns

Mengyang Li, Dahai Li, Chen Zhang, Kewei E, Zhihan Hong, Chengxu Li

Proceedings Volume 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 962319 (2015) https://doi.org/10.1117/12.2193310
Event: International Conference on Optical Instruments and Technology 2015, 2015, Beijing, China

Abstract

Zonal wavefront reconstruction by use of the well known Southwell algorithm with rectangular grid patterns has been considered in the literature. However, when the grid patterns are nonrectangular, modal wavefront reconstruction has been extensively used. We propose an improved zonal wavefront reconstruction algorithm for Hartmann type test with arbitrary grid patterns. We develop the mathematical expressions to show that the wavefront over arbitrary grid patterns, such as misaligned, partly obscured, and non-square mesh grids, can be estimated well. Both iterative solution and least-square solution for the proposed algorithm are described and compared. Numerical calculation shows that the zonal wavefront reconstruction over nonrectangular profile with the proposed algorithm results in a significant improvement in comparison with the Southwell algorithm.

Citation Download Citation

Mengyang Li, Dahai Li, Chen Zhang, Kewei E, Zhihan Hong, and Chengxu Li "Improved zonal wavefront reconstruction algorithm for Hartmann type test with arbitrary grid patterns", Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 962319 (7 August 2015); https://doi.org/10.1117/12.2193310

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