Paper
23 September 2015 Imaging spectroscopic reflectometer based on pellicle beamsplitter
J. Vodák, V. Čudek, P. Nádaský, M. Ohlídal
Author Affiliations +
Abstract
Imaging spectroscopic reflectometry is a technique suitable for measurements of local optical parameters (thickness, refraction index and index of extinction) of non-uniform thin films along their surface. It is usually assumed that gradients of these non-uniformities are reasonably small. A new design of an imaging spectroscopic reflectometer provides the possibility to successfully measure high gradient non-uniformities along relatively large area of a thin film surface. A specialized low cost apparatus was developed to accomplish a higher resolution of surface imaging at the cost of reduction of the spectral range usable. The whole concept of the imaging spectroscopic reflectometer was designed to achieve high light throughput using only prefabricated optical components. Shorter measurement times and lower demands on an imaging camera used were achieved. The imaging spectroscopic reflectometer mentioned above was realized as a compact device with easy calibration and handling. Any monochromator with its output into an optical fiber can be used as a source of light. The potential of the device is demonstrated using samples with high gradients of thickness along their surfaces. A significant improvement in the resolution of thin film interference pattern images was observed in comparison with the same images obtained by means of an older UV-VIS-NIR device.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Vodák, V. Čudek, P. Nádaský, and M. Ohlídal "Imaging spectroscopic reflectometer based on pellicle beamsplitter", Proc. SPIE 9626, Optical Systems Design 2015: Optical Design and Engineering VI, 96262L (23 September 2015); https://doi.org/10.1117/12.2190947
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Cited by 2 scholarly publications.
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KEYWORDS
Reflectance spectroscopy

Beam splitters

Pellicles

Reflectometry

Imaging spectroscopy

Intelligence systems

Thin films

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