Paper
23 November 2015 Lowering evaluation uncertainties in laser-induced damage testing
Lars O. Jensen, Marius Mrohs, Mark Gyamfi, Heinrich Mädebach, Detlev Ristau
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Abstract
As a consequence of the statistical nature of laser-induced damage threshold measurements in the nanosecond regime, the evaluation method plays a vital role. Within the test procedure outlined in the corresponding ISO standard, several steps of data reduction are required, and the resulting damage probability distribution as a function of laser fluence needs to be fitted either based on an empirical regression function or described by models for the respective damage mechanism.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lars O. Jensen, Marius Mrohs, Mark Gyamfi, Heinrich Mädebach, and Detlev Ristau "Lowering evaluation uncertainties in laser-induced damage testing", Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 96321J (23 November 2015); https://doi.org/10.1117/12.2194944
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KEYWORDS
Laser induced damage

Standards development

Data modeling

Laser damage threshold

Error analysis

Pulsed laser operation

Statistical analysis

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