An analysis of light spot extracting based on LED

Kai Ma; Zhan Shi; Chao Chen; Xiaodong Pan; Wenbin Liu

doi:10.1117/12.2242784

25 October 2016 An analysis of light spot extracting based on LED

Kai Ma, Zhan Shi, Chao Chen, Xiaodong Pan, Wenbin Liu

Proceedings Volume 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics; 96870B (2016) https://doi.org/10.1117/12.2242784
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China

Abstract

Light spot centroid detection is one of the key technologies in optical measurement. In order to overcome the poor stability caused by small scale spot, we proposed an extract method by using saturated light spot in this paper. By increasing the input voltage of LED and adjusting the exposure time of CCD, the image of LED which projected in the image plane become larger, it can help enhancing the stability of light spot centroid extracting. The experiment results showed that the extract stability of saturated light spot has improved obviously compared with small scale spot. This method can be adopted in close range measurement; it reflected the sub-pixel coordinate of spot in image plane coordinate more accurately after calibrating the distorted image.

Citation Download Citation

Kai Ma, Zhan Shi, Chao Chen, Xiaodong Pan, and Wenbin Liu "An analysis of light spot extracting based on LED", Proc. SPIE 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870B (25 October 2016); https://doi.org/10.1117/12.2242784

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