Paper
29 July 2016 Dimensional stability testing in thermal vacuum of the CHEOPS optical telescope assembly
W. A. Klop, A. L. Verlaan
Author Affiliations +
Abstract
The CHEOPS mission (CHaracterising ExOPlanet Satellite) is dedicated to searching for exoplanetary transits by performing ultra-high precision photometry on bright stars already known to host planets. A 32cm diameter on-axis Ritchey-Chrétien telescope is used for imaging onto a single cooled detector. With integration times up to 48 hours the thermal stability of the telescope and its structure are key to the performance. Using a multi-lateration interferometer setup TNO has successfully demonstrated the μm-level stability of the Structural Thermal Model (STM2) of the Optical Telescope Assembly (OTA) in thermal vacuum. This OTA was later upgraded to become the Flight Model. Experiments comprise thermal vacuum cycling, thermal vacuum stability testing where axial and lateral deformations are measured to the nm-level sensitivity.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. A. Klop and A. L. Verlaan "Dimensional stability testing in thermal vacuum of the CHEOPS optical telescope assembly", Proc. SPIE 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave, 990437 (29 July 2016); https://doi.org/10.1117/12.2232899
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Telescopes

Mirrors

Metrology

Interferometers

Space telescopes

Optical fabrication

Optical telescopes

RELATED CONTENT

JWST center of curvature test method and results
Proceedings of SPIE (September 05 2017)
Design for drop in assembly employed in an off axis...
Proceedings of SPIE (September 06 1995)
Design of a shuttle-based space debris telescope
Proceedings of SPIE (July 01 1990)
TNO TPD contributions to high precision optical metrology a...
Proceedings of SPIE (September 30 2004)

Back to Top