Paper
27 July 2016 Design of a wide field far-UV spectrometer for a mission to Mars
Edward Wishnow, Tim Miller, Matthew Fillingim, Jerry Edelstein, Robert Lillis, Eric Korpela, Scott England, William Van Shourt, Oswald Siegmund, Jason McPhate, Sasha Courtade, David Curtis, Justin Deighan, Michael Chaffin, Abdullah Saif Harmoul, Hessa Rashid Al Matroushi
Author Affiliations +
Abstract
An imaging spectrometer for observations of the Martian corona and the Martian thermosphere is presented. The corona extends over 10 Martian radii and its measurement requires observations over a very wide field. The spectrometer covers the wavelength region 120-170 nm where this band includes coronal spectral lines of hydrogen Lyman alpha and oxygen, and thermospheric spectral lines from atomic oxygen and carbon and the 4th positive band of CO. Stellar occultation observations will provide atmospheric density measurements. These scientific requirements are fulfilled by an Offner-type spectrometer with a 110 degree instantaneous field of view and no moving mechanisms. Both the spectral and imaging resolution vary across the field, from higher resolution across the planet body, to lower resolution required at the diffuse outer parts of the corona. This Offner-type design has not been previously used in the FUV.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edward Wishnow, Tim Miller, Matthew Fillingim, Jerry Edelstein, Robert Lillis, Eric Korpela, Scott England, William Van Shourt, Oswald Siegmund, Jason McPhate, Sasha Courtade, David Curtis, Justin Deighan, Michael Chaffin, Abdullah Saif Harmoul, and Hessa Rashid Al Matroushi "Design of a wide field far-UV spectrometer for a mission to Mars", Proc. SPIE 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, 990538 (27 July 2016); https://doi.org/10.1117/12.2233512
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Ultraviolet radiation

Edge roughness

Sensors

Reflectivity

Platinum

Reflection

Charge-coupled devices

RELATED CONTENT


Back to Top