Adaptive grating interferometric sensor for NDE metrology in high energy electromagnetic environment

George Dovgalenko; Kadir Altintepe; Michael Bodnar; Joseph Prokop

doi:10.1117/12.2236980

28 August 2016 Adaptive grating interferometric sensor for NDE metrology in high energy electromagnetic environment

George Dovgalenko, Kadir Altintepe, Michael Bodnar, Joseph Prokop

Proceedings Volume 9960, Interferometry XVIII; 99600V (2016) https://doi.org/10.1117/12.2236980
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

CCD cameras and CMOS devices are the major electronic components of industrial metrology, which are vulnerable to high level electromagnetic exposure. Typical sources of exposure of electronics to ionizing radiation are the Van Allen radiation belts for satellites, nuclear reactors in power plants for sensors and control circuits, particle accelerators for control electronics particularly particle detector devices, residual radiation from isotopes in chip packaging materials, cosmic radiation for spacecraft and highaltitude aircraft, and nuclear explosions for potentially all military and civilian electronics. A total dose 5 ×10³ rad was delivered to silicon-based devices in seconds to minutes caused long-term degradation. We demonstrated adaptive grating, 3D image sensor for NDE metrology which is non vulnerable for high level X-Ray1 and 3 × 10⁶ rad gamma radiation exposure. Sensor is based on adaptive holographic grating generated by 632.8 nm He-Ne laser - in doped electro optic Bismuth Titanate (BTO) monocrystal. Mathematical algorithm of bipolar model conductivity in BTO crystal has been applied for experimental analyses. Applications of proposed sensor for airspace, military, nuclear and civil engineering industries have been discussed.

Conference Presentation

Citation Download Citation

George Dovgalenko, Kadir Altintepe, Michael Bodnar, and Joseph Prokop "Adaptive grating interferometric sensor for NDE metrology in high energy electromagnetic environment", Proc. SPIE 9960, Interferometry XVIII, 99600V (28 August 2016); https://doi.org/10.1117/12.2236980

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