Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

Thomas A. Germer; Martin Foldyna; Zuzana Mrazkova; Guillaume Fischer; Etienne Drahi

doi:10.1117/12.2236976

26 September 2016 Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

Thomas A. Germer, Martin Foldyna, Zuzana Mrazkova, Guillaume Fischer, Etienne Drahi

Author Affiliations +

Proceedings Volume 9961, Reflection, Scattering, and Diffraction from Surfaces V; 996107 (2016) https://doi.org/10.1117/12.2236976
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.

Citation Download Citation

Thomas A. Germer, Martin Foldyna, Zuzana Mrazkova, Guillaume Fischer, and Etienne Drahi "Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces", Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 996107 (26 September 2016); https://doi.org/10.1117/12.2236976

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